Apple Inc. v. Samsung Electronics Co. Ltd. et al

Filing 1346

Unredacted Exhibits to Bartlett Decl ISO Apple's Response to Samsung's Opening Memo Re Design Patent Claim Construction (Dkt. No. 1140) re 1256 Order on Administrative Motion to File Under Seal, by Apple Inc.. (Attachments: # 1 Exhibit 2, # 2 Exhibit 3, # 3 Exhibit 4, # 4 Exhibit 5, # 5 Exhibit 6, # 6 Exhibit 7, # 7 Exhibit 8, # 8 Exhibit 9, # 9 Exhibit 10, # 10 Exhibit 11, # 11 Exhibit 12, # 12 Exhibit 13, # 13 Exhibit 14, # 14 Exhibit 27)(Jacobs, Michael) (Filed on 7/25/2012) Modified text on 7/26/2012 (dhm, COURT STAFF).

Exhibit 9
(Submitted Under Seal)

Subject: Touch Exec Review (iPod/iPhone) Charts w/Actions
Date: Fri, 21 Nov 2008 21:38:06 -0800
From: "Jason Otoshi" <[e-mail]>
To: "Vic Alessi" <[e-mail]>, "Shin John Choi" <[e-mail]>, "Heidi
Delgado" <[e-mail]>, "Richard Dinh" <[e-mail]>, "Martin Grunthaner"
<[e-mail]>, "Andy Hodge" <[e-mail]>, "Shige Honjo" <[e-mail]>,
"Steve Hotelling" <[e-mail]>, "Ben Kunst" <[e-mail]>, "Benjamin Lyon"
<[e-mail]>, "Ryan Naone" <[e-mail]>, "Donald Novotney"
<[e-mail]>, "Achim Pantfoerder" <[e-mail]>, "matt riedstra"
<[e-mail]>, "Kuo Sung" <[e-mail]>, "Tang Tan" <[e-mail]>,
"Ray Tse" <[e-mail]>, "David Tupman" <[e-mail]>, "Lynn Youngs"
<[e-mail]>, "Raymond Yuen" <[e-mail]>, "Stephen Zadesky"
<[e-mail]>, "John Zhong" <[e-mail]>, "James Wang" <[e-mail]>
CC: "Steve Martisauskas" <[e-mail]>, "James Chang"
<[e-mail]>, "SeungJae Hong" <[e-mail]>, "Brian Strom"
<[e-mail]>, "Priya Balasubramaniam" <[e-mail]>, "Joyce Fanchiang"
<[e-mail]>
Message-ID: <[e-mail]>

All,
Enclosed are the charts from the Exec Review from yesterday. Also
included on the first two pages are the actions from the review.
Let me know if any of the actions require corrections, or if any were
missed.
Thanks for your time.
Jason

------ end message ------

Highly Confidential - Attorneys' Eyes Only

APLNDC0002303105

Action Items: 11/20 Executive Review
#

Description

DRI

ECD

Kuo/LCM
team

Proto1

12/31

1

For full lamination, in addition to experimental studies, establish science-based methodology to
study and guarantee by design and specifications:
a) LCD minimum resistance to touch panel lamination influencing parameters and
b) Touch panel guaranteed maximums for parameters that influence LCD

2

Expedite SOW for SITO with TPK to enable technical engagement.  Put together timeline for bringup of each supplier, to establish deadline for when the SOW must be completed.

Priya

3

Chemical thinning may have long lead-time for equipment bring-up due to China permit lead-time,
start the process ASAP.

Priya/Kuo

4

Ensure additional testing of LCD's at Grape suppliers does not damage LCD connectors.  Ensure
non-locking connectors are available in time for testing of LCD's and Grape's at engineering builds.

Jason/
Richard

5

Investigate if switching to a different type of glass (other than soda lime, consider Corning Gorilla
glass) will improve cutting yields for thinned SITO. Need to study the 0.3 Corning Gorilla glass (Gen James/Kuo
2), which can be chemically strengthened.

6

System and Grape team to develop a way to assure a smoother bring up (grape tester emphasis) for
EVT2 FATP. Validate before team travels to EVT2. (Include Tony, Julia, and Abel)

Jason

EVT2 BRR

7

Set up a SITO checkpoint after EVT2 to assess the design status prior to approval for DVT.

Jason

1/31

8

Coordinate a small quantity of Wintek DITO to be built to support EVT2 (primarily to support
desense testing).

Jason

1/15

9

Confirm that the shield tape is the root cause of the “yellow spot” found in the full lamination
investigation results.

Kuo

1/07

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

Proto1

1/15

20 November 2008

APLNDC0002303106

Action Items: 11/20 Executive Review
#

Description

10

Conduct a peel strength test using glass-to-PSA-to-polarizer.

11

Purchase HTC phones (which have an IPS display) to conduct an early evaluation of IPS full
lamination

12

System PD and Grape PD to find an adequate location for a pull tab--to allow re-workable PSA to be
utilized in the design

13

Present latest cost estimates for Full Lamination at next Exec. review.

DRI

ECD

Kuo

1/07

Jason

12/01

Rich/
Steve M.

pre-tool
release

Jason

14
15
16
17
18

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303107

Grape SITO Executive Review
20 November 2008

Apple Confidential - Need to know

Highly Confidential - Attorneys' Eyes Only

APLNDC0002303108

Agenda

■ Action status and SITO Stoplight Review
■ Rationale for SITO in N88 and N90
■ SITO Development Status
■ N90 Full Lamination/Re-Workable PSA Status
■ N90 0.30mm/0.25mm Thinning Status
■ N90 Supply Base Proposal

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303109

Action Items from 10/16 exec. review
#

Description

Status

1

Investigate glass-to-glass adhesion for BOC concept

BOC de-prioritized

2

Investigate Flextronics in touch business

initial meetings held, considering for trackpads,
monitoring for touch screen

3

Review N72B and N18 schedule for SITO intersection and cost
opportunities

DITO is POR

4

Understand N82 prox ESD issues and how it might apply to SITO
ESD issue

Complete: Meeting with J. Tam took place and
lessons learned will be implemented in module
process steps.

5

For re-workable lamination validation, measure glass strength
before and after rework

DOE in process

6

For re-workable lamination implementation, track units which
have been reworked

DOE in process

7

Refresh air-gap vs. full lamination comparison for N90, including
3.85” size, LCD types, cost, capacity, product benefits and risks

N90 full lam is POR; 3.5” is POR
LCD type/cost/capacity (Priya/James)

8

Schedule 3.85” proof of concept SITO build targeting alignment
with N90 tool release

3.5” is POR

9

Refine estimate of 3.85” 16 row panel X and Y growth

3.5” is POR

10

Provide update on N72 Grape Cal / PostCal issue

offline discussion

11

Investigate in-store tilt assembly replacement strategy for N82
and N88

offline discussion

Core Technology

Highly Confidential - Attorneys' Eyes Only

Apple Need-to-Know Confidential

5

APLNDC0002303110

SITO Stoplight
Issue / Task

1

Root Cause

Perceivable performance
differences SITO vs. DITO

Corrective Action

CA Validation

Test Showing issue

routing traces in active
region

• systematic algorithm
correction

• 11/25, spec set by
Platform Experience
• 12/12, validation of
corner units against
spec

• drawing with finger or
probe
• robot scan

• ground ring design on
mothersheet
• anti-ESD protection film or
EVT2
printed protection film
• ESD discharge path design in
module assembly

2

ITO ESD sensitivity and
latent field failure

ITO damage due to in
process ESD exposure

3

Test and Calibration Yield

need to be evaluate system
Current calibration method
level calibration result
is not valid for SITO

4

Validate SITO noise
interference DPI
performance

validation task

Color code:

high level risk, possible show-stopper

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

Result: SITO DPI on par with
DITO at same noise
interference level

medium level risk, show-stopper not expected

SITO test and OM
inspection

N88 EVT2

module and system level
calibration

Complete

Robot DPI testing
Noise injection testing

low level risk

20 November 2008

APLNDC0002303111

Agenda

■ Action status and SITO Stoplight Review

■ Rationale for SITO in N88 and N90
■ SITO Development Status
■ N90 Full Lamination/Re-Workable PSA Status
■ N90 0.30mm/0.25mm Thinning Status
■ N90 Supply Base Proposal

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303112

Why SITO for N88 and N90
■ Ability to thin Touch Panel glass for future architectures
■ SITO is required to support the N90 requirement for 0.30 mm
(or possibly thinner) Grape glass
■ Work out all performance, process, test, and reliability issues in
mass production in N88, at one vendor, prior to distributing the
SITO design to all vendors for N90
■ The N90 design challenges will then be:

-

Developing SITO TF processes at multiple vendors
Developing thinning process at multiple vendors

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303113

N88-N90 Schedule
Glass
MCO
locked

design
meetings
start
RFQ

LCM at
Grape
Vendors

2
10/29 11/13

Module
MCO
locked
module/
FPC
TR

12/22

4

12/19

D-E3
(A1)

D-E2
(A0)

D-D1
(B0)

FPC/
Module HT

HT Update

Glass & Pol
MP Mat’l
Order Appr

D-D2
(B0)

11 from
glass TR

2

1/7

Materials
at LCM
D-E1
(A0)

12/23
3/11 3/25

1/21

5/7

6/18

7/14

9/3

11/24

9/29

2

2

2

D-P1
(B0)

1/20 2/10
1/13

Glass
TR

D-D3
(B0)

2/8

3/10

Driver IC
Module
MP Mat’l FPC/Module Assy
MP Mat’l
Order
Appr
Appr Order Appr

2
1

1

1.5

D-E1
(A0)

D-E3
(A1)

D-D1
(B0)

D-D2
(B0)

D-D3
(B0)

D-P1
(B0)

4/8

Grape LCM
Ship

D-E2
(A0)

5/19

6/30

9/15

12/3

2/17

3/22

1

1

1

1

1

EVT1

EVT2

DVT

DVT(FTA)

PVT

7/7

9/22

12/8

2/22

3/29

1

N90
System
FATP
N88
System
FATP

ID
Freeze

TR

10/27

H2P B0
AP Dev1 Proto1

12/19

2/10

3/10

H3P A0
AP Dev2 Proto2
4/21

EVT2

Nov

PVT

1/08
Oct

DVT
3/05

5/26

4/17

Dec

Jan

2008

Feb

Mar

Apr

May

Jun

July

2009

Aug

Sept

Oct

Nov

Dec

Jan

Feb

Mar

Apr

2010

(LCM with Line Inversion)
Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303114

Agenda
■ Action status and SITO Stoplight Review
■ Rationale for SITO in N88 and N90

■ SITO Development Status
■

Performance

■

Yields by Config. (Alt. B is PoR)

■

Escalation: SITO in N88 EVT2

■ N90 Full Lamination/Re-Workable PSA Status
■ N90 0.30mm/0.25mm Thinning Status
■ N90 Supply Base Proposal
Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303115

5mm Probe

Diagonal Customer Use Smooth LUT and
5mm Probe
DITO vs. SITO Line Test Comparing Comparison Projected

0xFB51 Diagonal Line Test - Using Ruler, Normal Drawing Speed, and New Ampl

SITO LUTLUT
Smooth LUT
New +
v0xFC51

DITO
FA51 LUT
DITO

New LUT
Smooth LUT
SITO +Smooth LUT
LUT
New LUT

v0xFC51

5mm Probe
5 mm Probe (~stylus)
5mm Probe
New LUT

FA51 LUT

SITO drawing
Smooth LUT
Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

DITO

FA51 LUT
DITO
DITO
FA51 LUT

New LU
New LUT

DITO

Probe
Pogo Stylus(~finger)
10 mm 10mmProbe
Probe Stylus
10mm
Pogo
New LUT

Left panels show X-centroid corrected p
Right panels show
app demo DITO path data.

New LUT

FA51 LUT

Smooth LUT

DITO
20 November 2008

APLNDC0002303116

DITO vs. SITO Quantified Error
Absolute Error

Ripple Error

proposed spec limit

proposed spec limit

probe diameter

probe diameter

- Proposed spec limits set that all SITO panels must pass
- Final spec limits to be set by Platform Experience demo on 11/25
- Target 12/12 for 1st pass validation of corner units against spec
Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303117

ITO ESD Damage in Proto3
100.0%

95%

Before Corrective Action (OM)

90.0%

84%

Failure Rate

80.0%

After Corrective action (OM)
After Corrective Action (SITO Test)

70.0%
60.0%

POR EVT2

50.0%
40.0%
30.0%

31.1%

20.0%
TF Process- SEM Analysis on Alt-C

10.0%
0.0%

43pcs 180pcs

Alt-B’

‣
SiO2 as well as ITO peel off on
damage area.

ITO Damage

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

33

‣
‣
‣

9.3%

3.9%

2.7%

49pcs

182pcs

Alt-C

0%

37pcs

1.3%

0.7%

149pcs

Alt-B

Counter measures reduced failure rate, but not
completely eliminated it.
SITO test can not be used to screen out the defects.
Continuous improvement needed for EVT2
Alt B is POR for EVT2.
20 November 2008

APLNDC0002303118

Reliability FMEA High Level Risks
Scenario

Hazard

Actions

Module sees static electrical fields at tilt assembly ESD causes module failure, reducing system yield
or system assembly
at FATP

· Module-level ESD testing
· ESD audit at FATP

Unit sees static electrical fields during use

· System-level ESD testing

ESD causes ITO damage

Unit built with ESD damage escapes screens and ITO degradation causes open where ITO line is
is built into the product.
narrowed

· Heat soak testing with
known damaged modules

De-lamination of ITO from metal in the vias, deInternal system temperature swings OR externally
lamination/breaking of ITO crossover traces due to
applied bending stresses during use
TCE mismatches or bending stress.

· Temperature cycling of test
panels with many vias

Contamination on the surface of metal/ITO in the
vias or at panel edges

Corrosion of metal during touch panel operation
over time.

· Sweat tests

PSA chemistry contributes to electrochemical
corrosion

Metal corrodes, causing open in ITO lines in
crossover region

· Heat Soak testing

ITO is scratched; relatively narrow ITO traces
heighten the risks of a hazardous scratch

ITO degradation causes open where ITO line is
scratched

- Heat Soak testing

Moderate risk
Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

Early data suggest low risk
20 November 2008

APLNDC0002303119

Executive Recommendation
-

Grape Team Assessment: SITO performance is close to
current N82 DITO (checkpoint on 12/9 for performance
spec sign-off)

-

Bringing up SITO in mass production for N88 will
mitigate the risks for 100% use in N90

-

Grape Team Recommendation: Proceed with SITO at
Wintek for N88 EVT2

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303120

N90 Grape Stoplight
Risk

Full Lamination Mura with IPS

Description

LCM & Grape full lamination may result in LCM
Mura. IPS (FFS) is particularly sensitive to cell gap
variations.

Develop SITO thinning capability To date, only Wintek has demonstrated one-sided
at multiple Grape vendors in MP glass thinning (SITO) in small sample sizes.

Performance of Thinned SITO

Performance of thinned SITO with thinner CG not
yet characterized (sensitivity to process variations-thickness)

Dependence on LCM/driver and Verification and validation of grape module will be
CG/frame design maturity and dependent on any changes to LCM/driver and CG/
schedules
frame.
High level risk- possible show stopper

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

Medium level risk, show stopper not expected

Mitigation Plan

- Need IPS (FFS) LCM samples early in Full
Lamination studies to determine
feasibility before tool release (1/9).
- LCM mura evaluation, pending LCM design freeze
and obtaining samples for trial at multiple Grape
suppliers
- Consider limiting pairings of IPS LCM vendors with
Grape Vendors
- Obtain a commitment date from two
vendors for thinning capability validation
build by Proto1.
- Evaluating capabilities of all vendors to implement
glass thinning with SITO design
- Run simulations of thinned SITO and thin
CG to determine risk level.
- Characterization and tuning of SITO in N88 will
reduce uncertainty of thinned SITO performance, but
evaluation of N90 stackup is still required.
- Plan to assess thinned SITO in retrofitted N88
systems.
- Close with the LCM team on
implementation strategy/plan.
- Work with LCM and System PD teams to highlight
M68 lessons learned.
- Lock CG/frame design at EVT.
Low level risk

20 November 2008

APLNDC0002303121

N90 Grape Stoplight (cont.)
Risk

Full Lamination Bubbles

Description

LCM & Grape full lamination with thin PSA may
result in lamination bubbles.

Mitigation Plan

- Thin PSA investigation and trial.

Mechanical Reliability of Thinned Combination of thinner CG and thinner Grape glass
non-CS SITO glass
may decrease mechanical reliability

- 0.30mm and 0.25mm SITO glass provided to system
team for mechanical evaluations. (air gap only to date)
- Planned evaluation of thinned SITO in full lamination
stack (mid Dec.)

Full lamination requires functional failures of LCMs to
OQC and IQC for LCM/driver
be identified as early as feasible before integration
in Supply Chain
with grape.

- Close with the LCM team on implementation
strategy/plan
- LCM team is developing a “bridge chip” to allow full
functional testing at grape vendor IQC and OQC

Populate SITO to multiple
Grape vendors

To date, only Wintek has developed SITO

High level risk- possible show stopper

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

Medium level risk, show stopper not expected

- Evaluating capabilities of all vendors to implement
SITO design
- Mature design with one vendor (in N88) and
develop processes at other vendors

Low level risk

20 November 2008

APLNDC0002303122

Agenda
■ Action status and SITO Stoplight Review
■ Rationale for SITO in N88 and N90
■ SITO Development Status

■ N90 Full Lamination/Re-Workable PSA Status
■

Investigation Description

■

Initial results

■

Next steps

■ N90 0.30mm/0.25mm Thinning Status
■ N90 Supply Base Proposal
Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303123

Full Lamination

(Test Vehicle: N82)

Cover Glass

OCA (CG/Touch Sensor)
175um
Touch Sensor
N82: DITO
N88: SITO
N90: SITO

Full Lamination
- POR: 175um (same as M68)
- Thin OCA
- Re-workable OCA (shown)

OCA (Touch Sensor/LCM)
175um

LCM

Apple Confidential

Highly Confidential - Attorneys' Eyes Only

APLNDC0002303124

DOE summary
PSA

LCM

(Test Vehicle: N82)

Req Qty

Built Qty

Passed (bubble Free)

Defect

Cosmetic Waived
(not included in yield)

Baseline: 175um
3M 8187

Sharp

28

35

32 (91%)

1 particle (3%)
2 residue (6%)

Yellow mark on LCM (100%)
LCM Mura (22%)

Thin: 150um
3M 8186

Sharp

48

51

29 (57%)

15 bubble (29%)
(OCA material issue)
7 particle (14%)

Yellow mark on LCM (100%)
LCM Mura (95%)

Thin: 125um
3M 8185

SamSung

48

50

47 (94%)

2 particle (4%)
1 residue (2%)

Yellow mark on LCM (100%)
LCM Mura (0%)

Thin: 100um
3M 8184

SamSung

48

49

43 (88%)

1 bubble (2%)
4 particle (8%)
1 residue (2%)

Yellow mark on LCM (100%)
LCM Mura (38%)

Reworkable: 175um
3M X-1044

TMD

60

49

18 (37%)

22 bubble (45%)
9 particle (18%)

Yellow mark on LCM (100%)
LCM Mura (100%)

Sharp

-

10

8 (80%)

1 bubble (10%)
1 particle (10%)

Yellow mark on LCM (100%)
LCM Mura (not recorded)

Reworkable: 175um
3M X-1066

TMD

33

34

7 (21%)

27 bubble (79%)

Yellow mark on LCM (100%)
LCM Mura (15%)

Reworkable: 178um
TPK G2

TMD

48

‣
‣
‣

Data on 11/21

Non-reworkable OCA (100~175um) have similar full lamination bubble performance as
M68.
Reworkable OCA (175um) have much worse full lamination bubble performance than
M68. This may due stack-up variation in different LCMs
All OCA has yellow mark and some with lamination mura that needs to be addressed

Apple Confidential

Highly Confidential - Attorneys' Eyes Only

APLNDC0002303125

Material Characterization (Strength)
PSA

Peel Strength (N/cm)
DITO/OCA

Baseline: 175um
3M 8187

5.3

Tensile Strength

OCA/LCM
4.0

Observation

(N)
215.9

Thin: 150um 3M 8186

Note: data available 11/27

Thin: 125um 3M 8185

Note: data available 11/27

Thin: 100um 3M 8184

Note: data available 11/27

Reworkable: 175um
3M X-1044

2.4

3.6

133.7

- Low Peel due to stretch release nature
- Lower Tensile vs. baseline

Reworkable: 175um
3M X-1033

7.7

6.7

67.3

- Higher Peel vs. X-1044
- Lower Tensile vs. X-1044

Reworkable: 175um
X-1056

1.5

1.9

73.4

- Very low peel
- Lower Tensile vs. baseline

Reworkable: 175um
3M X-1066
Reworkable: 178um
TPK G2

Note: data available 11/27

13.0

0.1

50.9

- Very low peel on low adhesion side
- Low tensile

- Thin PSA data: data available 11/27 (driving supplier for data submission)
- Re-workable PSA data do not offer a suitable strength combination in both shear &
tensile directions for N90 structure.
Apple Confidential

Highly Confidential - Attorneys' Eyes Only

APLNDC0002303126

Forward Plan
Full Lamination
Item

Description

Action

DRI

Due Date

1

N90 LCM type
lamination evaluation

- obtain FFS/IPS LCM in ~3.54” for full
lamination evaluation (mura, yellow mark..etc)

LCD/PPO

12/x/08

2

Full Lamination process
(Grape/LCM) using N82

- process optimization to remove Mura
- increase process margin
- quantify process window

PPO

1/07/09

3

OCA material

- Measure mura vs. surface topology &
thickness
- additional OCA sources evaluation

PPO

1/07/09

4

Mechanical evaluation

- Module & System level mechanical
performance evaluation

PPO/PD/REL 12/15/08

5

Environmental
evaluation

- Module level environmental performance
evaluation

PPO/PD/REL 12/23/08

High Risk - Very Limited Info/Unknown

Highly Confidential - Attorneys' Eyes Only

Mid Risk - some info, further evaluation needed

Low Risk - initial result positive. Continue optimization

Apple Confidential

APLNDC0002303127

Forward Plan
Re-workable Lamination
Item

Description

Action

DRI

Due Date

1

Rework methods

- Continue rework method DOEs

PPO

1/31/08

2

Re-workable adhesive

- Continue research on suitable material

PPO

1/31/08

3

Mechanical evaluation
using current available
re-workable PSA

- Module & System level mechanical
performance evaluation

PPO/PD/REL 1/31/09

4

Environmental
evaluation using current
available re-workable
PSA

- Module level environmental performance
evaluation

PPO/PD/REL 1/31/09

High Risk - Very Limited Info/Unknown

Highly Confidential - Attorneys' Eyes Only

Mid Risk - some info, further evaluation needed

Apple
Low Risk - initial result positive. Continue optimization Confidential

APLNDC0002303128

Agenda

■ Action status and SITO Stoplight Review
■ Rationale for SITO in N88 and N90
■ SITO Development Status
■ N90 Full Lamination/Re-Workable PSA Status

■ N90 0.30mm/0.25mm Thinning Status
■ N90 Supply Base Proposal

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303129

Glass Thinning Status Summary
Item

Description

Detail

DRI

Due

1

1st glass thinning trial result
(thin film through laser cut)

- 0.3mm 77%yield
* major issue is handling
- 0.25mm 56% yield
* Major issue is glass shattered during laser cut

---

---

2

2nd glass thinning trial result
(thin film through laser cut)

- 0.3mm 91%yield
* handling improvement

---

---

3

Laser scribe optimization

- raw glass scribing parameter did not work on thin SITO
below 0.3mm. Glass shattered
- MDI will work onsite at Wintek to optimize laser scribing
parameters for thin SITO below 0.3mm.

PPO-MD

12/1/08

4

Glass thinning requirements and
process baseline

- Specification requirements drafted
- Process baseline drafted
- requirements and process validation at Grape integrators

PPO-TF
PPO-MD

By Proto1

5

Glass thinning facility setup and
supply chain management

- Current Grape integrators status:
* Wintek: limited capacity, only support development
* TPK: no thinning facility
* Innolux: only mechanical etching
- Enable glass thinning capability at Grape integrators
either through in-house facility or outsource

PPO-TF
PPO-MD
Ops

By EVT

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303130

Agenda

■ Action status and SITO Stoplight Review
■ Rationale for SITO in N88 and N90
■ SITO Development Status
■ N90 Full Lamination/Re-Workable PSA Status
■ N90 0.30mm/0.25mm Thinning Status

■ N90 Supply Base Proposal

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303131

N90 Supply Base
Wintek

TPK

Innolux

SITO Exclusivity

ok

SOW needed

ok

SITO Thin Film

on-track

start after SOW

start after proven DITO
in N88 EVT2

Thinning
Equipment

Hanstar thinning OK, but
need SC-B bringup

start after SOW

mechanical thinning for
LCD; need chemical
thinning line

LCM Full Lam

Need a lot of Apple
support

M68 experience

good team, no MP
experience

Full Lam
Equipment

new equipment required

convert existing equipment

new equipment required

MP confidence
High level risk- possible show stopper

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

Medium level risk, show stopper not expected

Low level risk

20 November 2008

APLNDC0002303132

Full Lamination Capacity

- In general, full lamination reduces the capacity to half compared to
air-gap lamination. TPK and Innolux machine can be converted.
- Since Wintek does not have conversion capability, it’s full lamination
capacity is zero if they don’t purchase new machine. Depending on the
number of the new machine Wintek purchases to match, the full
lamination capacity can go as high as 3.4M per month.

Apple “Need-to-Know” Confidential

Highly Confidential - Attorneys' Eyes Only

APLNDC0002303133

■ Backup Charts

Apple Inc., Confidential & Proprietary

Highly Confidential - Attorneys' Eyes Only

20 November 2008

APLNDC0002303134